PAD裂纹导致PDP产品失效机理的研究  

Mechanism Study of PAD Crack Induced PDP Fail

作　　者：刘小红 陈倩 张爱军 曹玉文 

机构地区：[1]无锡华润上华科技有限公司,江苏无锡214000

出　　处：《电力电子技术》2013年第12期19-20,29,共3页Power Electronics

摘　　要：等离子体显示板(PDP)作为目前市场上主流的平板显示器,具有显示效果好、寿命长、视角广、响应快等优点。某一种高压PDP行扫描驱动功率集成芯片在某制造厂家工艺开发阶段遇到了低良率及高温运行寿命测试(HTOL)可靠性失效问题。对其进行失效分析,发现失效是中测(CP)测试导致平板电脑(PAD)裂纹造成;而失效根源与PAD结构的设计、CP测试和制造工艺的匹配性、工艺的进一步优化都直接相关。Plasma display panel（PDP） is a mainstream of flat panel display in the market.It has good display effect, long lifetime ,high look-angle,high response speed , etc. One PDP product suffered circuit probing（CP） low yield and high temperature operating life test（HTOL） issue when process develop.For improving the yield,the root cause of the failure is looked up.Finally, the root cause of failure is determined which is not induced by design or process or CP test,bat it＇s the matching issue of design,process and CP test.

关 键 词：等离子体显示板 裂纹 失效分析 

分 类 号：TN104.3[电子电信—物理电子学]