Step-stress Accelerated Degradation Test Modeling and Statistical Analysis Methods  

作　　者：CHEN Wenhua LIU Juan GAO Liang PAN Jun LU Xianbiao 

机构地区：[1]Mechanical Design Institute, Zhejiang University [2]School of Mechanical and Automatic Control, Zhejiang Sci-Tech University [3]Hangzhou Aerospace Electrical Technology Co. Ltd.

出　　处：《Chinese Journal of Mechanical Engineering》2013年第6期1154-1159,共6页中国机械工程学报（英文版）

基　　金：supported by National Natural Science Foundation of China(Grant Nos.50935002,51075370,51105341,51275480);Zhejiang Provincial Natural Science Foundation of China(Grant No.Y1100777);Zhejiang Provincial Key Scientific and Technological Innovation Team(Grant No.2010R50005)

摘　　要：In order to get a rapid assessment on the storage reliability of high-reliable and long-life products within the storage period, accelerated degradation test data with a large amount of reliability information of product is adopted. Conducting a constant-stress accelerated degradation test（CSADT） is generally very costly as it requires a large sample size and long time for test. To overcome this problem, it is necessary to carry out research on modeling and statistical analysis methods of step-stress accelerated degradation test （SSADT）. Taking electrical connectors as the object, a research is conducted on statistical model and assessment method for SSADT. On the basis of mixed-effect degradation path model, the statistical model of SSADT for electrical connectors is presented, the maximum likelihood method for SSADT data based on mixed-effect degradation model is proposed. SSADT accelerated by temperature stress is conducted to Y11X-1419 type of electrical connectors, and the storage reliability is assessed with the SSADT data. Compared with the result obtained from accelerated life test, the reliability estimation of 32-year storage period for electrical connectors obtained from S SADT data only have a difference of 0.869%, which validates the accuracy of the degradation model and the feasibility of the test data statistic analysis method put forward.In order to get a rapid assessment on the storage reliability of high-reliable and long-life products within the storage period, accelerated degradation test data with a large amount of reliability information of product is adopted. Conducting a constant-stress accelerated degradation test（CSADT） is generally very costly as it requires a large sample size and long time for test. To overcome this problem, it is necessary to carry out research on modeling and statistical analysis methods of step-stress accelerated degradation test （SSADT）. Taking electrical connectors as the object, a research is conducted on statistical model and assessment method for SSADT. On the basis of mixed-effect degradation path model, the statistical model of SSADT for electrical connectors is presented, the maximum likelihood method for SSADT data based on mixed-effect degradation model is proposed. SSADT accelerated by temperature stress is conducted to Y11X-1419 type of electrical connectors, and the storage reliability is assessed with the SSADT data. Compared with the result obtained from accelerated life test, the reliability estimation of 32-year storage period for electrical connectors obtained from S SADT data only have a difference of 0.869%, which validates the accuracy of the degradation model and the feasibility of the test data statistic analysis method put forward.

关 键 词：electrical connector performance degradation RELIABILITY accelerated degradation test 

分 类 号：O344.1[理学—固体力学]