X射线荧光光谱法对钒氧化物中不同价态钒的定量分析  

Quantitative Analysis of Valency States of Vanadium in Mixture of Vanadium Oxides by X-Ray Fluorescence Spectrometry

作　　者：谭秉和[1] 孙伟莹[1] 

机构地区：[1]北京科技大学化学系,北京100083

出　　处：《岩矿测试》2000年第4期245-248,共4页Rock and Mineral Analysis

基　　金：冶金部重点科研项目(96-03-24)

摘　　要：讨论用普通的X射线荧光光谱仪 ,采用谱峰分解法和谱峰合成法对钒氧化物的混合物中氧化态V2 O3、V2 O4、V2 O5 的定量分析。谱峰分解法系以每种钒氧化态的标准谱形函数为基础 ,用最小二乘法求解。而谱峰合成法则是以每种纯氧化态的测量谱线为基础 ,用定标技术求解。用上述方法测定钒氧化物产品 ,其结果与化学法、电化学法的结果一致 ,最大相对误差为7 7%。Two methods of peak resolution and peak synthesis with conventional X ray fluorescence spectrometry for quantitative analysis of vanadium valency states of V 2O 3, V 2O 4 and V 2O 5 in mixtures of vanadium oxides are developed. The peak resolution method is least square method based on the standard spectral profiles corresponding to each oxidation states of vanadium. The peak synthesis method is a calibration method based on measured spectra from pure oxidation state samples. The methods have been applied to the determination of vanadium valency states in vanadium oxide products. The results are in agreement with those provided by chemical method and electrochemical method with relative errors of ≤7.7%.

关 键 词：钒 X射线荧光 价态分析 谱峰分解法 谱峰合成法 

分 类 号：O614.511[理学—无机化学] O657.34[理学—化学]