基于函数切片的插装优化在软件测试中的应用  

Instrumentation Optimization based on Function Slice and its Application in Software Testing

作　　者：刘永恒[1] 胡璇[1] 

机构地区：[1]工业和信息化部电子第五研究所,广东广州510610

出　　处：《电子产品可靠性与环境试验》2013年第A01期155-159,共5页Electronic Product Reliability and Environmental Testing

摘　　要：首先对插装技术的基本理论和方法进行了介绍,指出了传统的插装方法应用在嵌入式软件逻辑覆盖测试中所面临的问题;然后针对插装后代码的膨胀情况,提出一种基于函数切片的插装优化方法,在使用同样测试工具的情况下,优化了插装程序的执行效率;最后通过实验验证了该方法的有效性。The theory and method of the instrumentation is introduced. Then the problems in the application of traditional instrumentation method to the embedded software testing are presented. For reducing the expansion of the code based on function slicing is proposed instrumented, an instrumentation optimizing strategy , which can improve the execution efficiency of the code instrumented when using the same test tool. In the end, the effectiveness of the proposed method is demonstrated by experiments.

关 键 词：源代码覆盖 嵌入式软件 函数切片 逻辑覆盖测试 

分 类 号：TP311.53[自动化与计算机技术—计算机软件与理论]