CINRAD/SA雷达回扫充电电路中IGBT的损坏成因及其判定方法  

Reasons of IGBT failure and its trouble determination method in fly-back charging circuit of CINRAD/SA radar

作　　者：梁钊扬 舒毅 吴国锐 

机构地区：[1]广东省肇庆市气象局,肇庆526060 [2]福建省泉州市气象局,泉州362000

出　　处：《气象水文海洋仪器》2013年第4期103-106,共4页Meteorological,Hydrological and Marine Instruments

摘　　要：发射机故障在整个雷达系统故障中占有较高比例,在发射机故障中由于充电组件(3A10)损坏所引起的故障概率更大,而在充电开关组件故障中由于绝缘栅双极晶体管(IGBT)击穿引起的又占大多数。IGBT在充电组件中处于大电流、高功率的工作状态,在线不易测量,这给保障工作带来一定的不便。本文通过对IGBT原理及回扫充电电路的工作过程的分析,给出了IGBT实际运行中出现的故障现象和排查该故障的检测要点,以期缩短故障定位及解决时间,提高雷达维修的效率。The transmitter failure is in a higher proportion of the entire radar system. Among transmitter failures,most of breakdowns are caused by the charger（3A10） failing. While the failure of insulated gate bipolar transistor （IGBT） is the most serious factor in the charger failing. It is so inconvenience to make a maintenance and fault location for the IGBT in the charger module with the state of high current and power. This paper describes the principle of IGBT and the working process of fly-back charging circuit. The IGBT failure phenomenon in the actual operation is analyzed and the investigation points for trouble shooting are given out. Therefore, the time to locate faults is shortened and the efficiency of radar maintenance is improved.

关 键 词：CINRAD SA雷达 回扫充电电路 绝缘栅双极晶体管(IGBT) 

分 类 号：P412.25[天文地球—大气科学及气象学]