光电开关BRE5M-TDT浪涌抗扰度试验不合格现象处理  

Reason analysis of photoelectric proximity switch BRE5M-TDT failing in surge immunity tests

作　　者：钱宁 

机构地区：[1]奥托尼克斯电子(嘉兴)有限公司,浙江嘉兴314033

出　　处：《传感器世界》2013年第12期36-40,共5页Sensor World

摘　　要：光电式接近开关产品BRE5M-TDT在浪涌抗扰度试验中出现产品损坏的现象。为了保证用户在使用时的安全性和可靠性,有必要对原有电路进行改进。尝试对光电式接近开关的工作原理、浪涌抗扰度试验的目的及测试方法和产品电路的特性这几个方面来进行统一分析,运用高压探头连结示波器,检测出浪涌电压在不同情况下所形成的干扰波形,并配合一系列的试验,给出不合格现象出现的原因。最终采用最经济的方法在不降低产品的其他性能的情况下解决所出现的问题。New photoelectric proximity switches BRE5MTDT are damaged in surge immunity tests. In order to ensure safety and reliability for users, it is necessary to improve the circuits of products. The working principle, purpose and method of surge immunity test, circuit characteristics of BRE5M-TDT are analyzed in this paper. By using high-voltage probes connected with oscilloscope, the interference waves of surge voltages formed in different situations are detected, and the reason why products are unqualified are figured out incoordination with a series of experiments. At last, a most economical way is presented to solve the problem without lowering the performance of the products.

关 键 词：光电式接近开关 浪涌抗扰度试验 压敏电阻 

分 类 号：TN36[电子电信—物理电子学]