小麦穗层整齐度的遗传研究  

Studies on Inheritance of Spike Layer Uniformity of Wheat

作　　者：姚维传 

机构地区：[1]安徽省农业技术师范学院,凤阳233100

出　　处：《种子》2000年第3期19-21,共3页Seed

摘　　要：通过对 2 0个小麦品种 (系 )两年的试验研究 ,明确了小麦穗层整齐度是一个遗传性状。该性状在品种 (系 )间存在明显的遗传变异 ,gcv=1 1 .99% ;遗传力较高 ,h2B=82 .5 %。穗层整齐度与产量呈弱正相关 ,遗传相关系数 rg=0 .3781 ;与株高呈极显著正相关 ,遗传相关系数 rg=0 .76The experimental results of two years(1996-1998) showed that the spike layer uniformity (SLU) of wheat was a genetic trait, and SLU was different remarkably among wheat lines. The genetic coefficient of variation (gcv) of SLU was 11.99%,the heritability (h 2 B) of SLU was 82.51%. There was a weak positive relationship between SLU and grain yield, with genetic correlation coefficient of 0.3781; and SLU was significantly positively related to plant height, with genetic correlation coefficient of 0.7687.

关 键 词：小麦 穗层整齐度 遗传变异 遗传参数 

分 类 号：S512.101[农业科学—作物学] S512.103.2