半导体封装测试生产线模型及其调度方法  

Math Model and Scheduling Method for the Semiconductor Assembling and Testing Line

作　　者：肖粲俊[1] 陈禾[2] 黄俊兵[2] 姚进[1] 

机构地区：[1]四川大学制造学院,四川成都610065 [2]北京理工大学信息与电子学院,北京100081

出　　处：《北京理工大学学报》2013年第11期1161-1164,1170,共5页Transactions of Beijing Institute of Technology

基　　金：四川省科技支撑项目(2009GZ0159)

摘　　要：针对成都某工厂半导体封装测试生产线上的调度问题,结合封装测试生产线的特点,建立了以完成加工任务为约束条件,同时考虑设备初始状态和切换时间,以最小化设备的最大运行时间为目标函数的数学模型.提出了基于自适应并行遗传算法求解半导体封装测试生产线调度的方法,算法同时综合了自适应遗传算法和并行遗传算法的优点.并对该工厂半导体封装测试生产线上的调度案例结果进行了分析,试验结果表明了该算法的有效性.For the real problem of a Chengdu factory＇s scheduling for semiconductor assembling and testing line, a math model for the single station is built on minimizing the maximum operation time of the equipment in which both the switching time and initial state are considered. Adaptive parallel genetic algorithm is proposed to solve this problem, combined with the genetic algorithm, which has high solution efficiency and good convergence. Finally, an example based on real data is given in order to illustrate the proposed method, and the results show its efficiency.

关 键 词：封装测试生产线 遗传算法 自适应并行遗传算法 调度方法 

分 类 号：TP315[自动化与计算机技术—计算机软件与理论]