X射线分光晶体高阶衍射效率标定方法  

Calibration of high order integral diffraction coefficient for X-ray plane crystal

作　　者：杨国洪[1] 李军[1] 韦敏习[1] 侯立飞[1] 易涛[1] 刘慎业[1] 

机构地区：[1]中国工程物理研究院激光聚变研究中心,四川绵阳621909

出　　处：《红外与激光工程》2013年第12期3325-3329,共5页Infrared and Laser Engineering

基　　金：国家自然科学基金(11105129)

摘　　要：包含高阶衍射的X射线分光晶体积分衍射效率是X射线光谱准确辨识、X射线分光晶体性能研究、X射线光谱定量测量和高分辨X射线单能成像的基础。基于X射线衍射仪,选择适当厚度的镍滤片和控制X射线管电压,极大地抑制Cu Kβ及韧致辐射,将X射线管光源Cu Kα单能化。以常用的X射线分光晶体季戊四醇[PET(002)]为样品,对X射线分光晶体的高阶积分衍射效率进行标定其结果表明,在Cu Kα能点,PET(002)晶体的积分衍射效率,二阶为一阶的14.36%,三阶为一阶的4.07%;Cu Kα1最大峰值比,二阶衍射为一阶的7.7%,三阶衍射为一阶的1.3%。基于X射线衍射仪的X射线分光晶体高阶衍射效率实验标定具有快速高效、方便灵活的特点。Integral diffraction coefficient including high diffraction order is the basis of identification of X-ray line, study of X-ray crystal characteristy, X-ray line intensity quantitative measurement and X-ray monochromatic image diagnosis. On the automatic X-ray diffractometer （XRD）, based on the stability and precision control of ？!and 2？!goniometer, special plane crystal holder was made. Bremsstrahlung and Cu Kβine were attenuated for 5 orders by 40 μ-thick pure Nickel filter in 15 kV and 20 mA supply to X-ray Cu tube, X-ray source of Cu taget is to be Cu K monochromatic source, transmission coefficient of Nickel filter is the criterion of Cu K？ monochromatic source. For X-ray Pentaerythritol （002） crystal, integral diffraction coefficient of 1-3 order diffraction on Cu Kanergy were calibrated. The results show that integral diffraction coefficient of the 2nd order and the 3rd order is only 14.36% and 4.07%, the Cu K？1 intensity ratio of the 2nd order and the 3rd order is only 7.7% and 1.3% compared with the 1st order diffraction. This kind of calibration is efficient and convenient on XRD in common laboratory.

关 键 词：高阶衍射 X射线分光晶体 标定 X射线衍射仪 

分 类 号：O722[理学—晶体学]