基于环形光电探测器阵列的表面反射特性测量装置  

A Device for Measuring Surface Diffuse Reflection Characteristics of a Material Based on Annular Photoelectric Detector Array

作　　者：冯刚[1] 闫燕[1] 杨鹏翎[1] 王振宝[1] 邵碧波[1] 王平[1] 

机构地区：[1]西北核技术研究所激光与物质相互作用国家重点实验室,西安710024

出　　处：《现代应用物理》2013年第4期335-338,342,共5页Modern Applied Physics

摘　　要：为了研究喷砂铝板表面的漫反射特性，基于环形光电探测器阵列和精密光学转台，设计了一种材料表面漫反射特性测量装置。该装置采用准直后的光纤激光作为光源，通过调整光学转台来调整激光入射角度，可以测量激光从不同角度入射时材料表面的反射特性。采用该装置对标准漫反射片的反射特性进行了测试，对测量结果进行拟合后显示，表面散射光的1维强度分布符合余弦分布特征，证明该装置设计是合理的。采用该装置测量了某种铝制漫反射片的表面反射特性。结果表明，这种采用喷砂工艺处理的铝板表面在入射角0°～20°范围内基本符合漫反射的特征。To study the diffuse reflection characteristics on the surface of sandblasted alumi- num boards, a device was designed for measuring diffuse reflection factor based on annular photoelectric detector array and optical rotary disk. A collimated fiber laser could be used as a perfect light source with the incident angle adjustable by rotating the rotary disk. Using the device, the intensity of the scattered light around the sample was measured when laser ir- radiates on the material surface at different incident angles, thus the diffuse reflection char- acteristics were calculated. To test the device, a standard diffuser was placed on the rotary disk and measurement was implemented. A perfect cosine curve proved that the design is practicable. The device was used to measure an aluminum diffuser and the results indicate that the surface of sandblasted aluminum board could be used as a diffuser for an incident angle of 0°-20°.

关 键 词：测量装置 漫反射特性 环形光电探测器阵列 

分 类 号：TN216[电子电信—物理电子学]