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作 者:ZHANG Peng WANG Yuan ZHANG Xing MA XiaoHua HAO Yue
机构地区:[1]Key Laboratory of Wide Band-Gap Semiconductor Materials and Devices,School of Microelectronics,Xidian University [2]Key Laboratory of Microelectronic Devices and Circuits,Institute of Microelectronics,Peking University
出 处:《Science China(Information Sciences)》2014年第2期285-290,共6页中国科学(信息科学)(英文版)
基 金:supported by National Basic Research Program of China(Grant No.2011CBA00606);Young Scientists Fund of the National Natural Science Foundation of China(Grant No.61106101)
摘 要:Due to latch-up issue, the main problem of silicon-controlled rectifier (SCR) tor power supply clamps in on-chip ESD protection is its inherent low holding voltage, especially in high-voltage applications. In this paper, we proposed a MOS-inside SCR (MISCR) showing nearly no snapback character and good ESD robustness, which is qualified for on-chip power clamp ESD protection. The stacked device achieves a series of triggering and holding voltage by altering the stacking number, which can also be used for the high voltage ESD power supply clamp applications.Due to latch-up issue, the main problem of silicon-controlled rectifier (SCR) tor power supply clamps in on-chip ESD protection is its inherent low holding voltage, especially in high-voltage applications. In this paper, we proposed a MOS-inside SCR (MISCR) showing nearly no snapback character and good ESD robustness, which is qualified for on-chip power clamp ESD protection. The stacked device achieves a series of triggering and holding voltage by altering the stacking number, which can also be used for the high voltage ESD power supply clamp applications.
关 键 词:electrostatic discharge (ESD) SCR latch-up immunity holding voltage power supply clamp high voltage
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