嵌入式系统中硬件关键性能指标测试模块的设计与实现  

Design and Realization of the Hardware Properties' Testing Program in the Embedded System

作　　者：琚成 梁天翼[1] 贾芸芳[1] 

机构地区：[1]南开大学电子信息与光学工程学院,天津300071

出　　处：《南开大学学报（自然科学版）》2013年第5期50-55,共6页Acta Scientiarum Naturalium Universitatis Nankaiensis

基　　金：天津市应用基础及前沿技术研究计划(12JCZDJC22400)

摘　　要：嵌入式系统具有软硬件可裁剪的特点,是当前电子系统开发的研究热点,获取嵌入式系统的硬件性能指标,是嵌入式系统开发的关键环节.以龙芯2F嵌入式系统为基础,设计开发了基于C语言的嵌入式系统硬件关键性能指标测试模块,实现了对其中央处理单元(CPU)、内存、显示芯片、以太网部件的硬件性能指标测试与显示.The embedded system has been the hotspot in the modern electronic systems＇ development, because of its good tailing-ability in the software and hardware developing. It is an important step to obtain the hardware properties in the whole development of the embedded system. Hardware properties＇ testing program was designed and developed based on the Longxin 2F embedded system by the use of C language It was realized by this presented pro- gram to examine and display the properties of CPU, memories, display chip and Ethernet parts.

关 键 词：嵌入式系统 硬件性能 龙芯2F CPU 

分 类 号：TP274[自动化与计算机技术—检测技术与自动化装置]