高真空扫描电镜低电压条件下花粉的显微组织研究  

Application of high-vacuum low-voltage scanning electron microscope for pollen microstructure

作　　者：覃丽禄[1] 刘莹莹[1] 张露[1] 

机构地区：[1]重庆大学材料科学与工程学院,重庆400045

出　　处：《分析仪器》2014年第1期69-72,共4页Analytical Instrumentation

基　　金：重庆市科技攻关项目(No.cstc2012gg-kp1A00025)

摘　　要：利用普通高真空扫描电镜,在低电压条件下对不同种类的花粉进行显微结构观察。结果表明在高真空环境下,样品未出现荷电、漂移现象,同时能得到的清晰、真实的微观形貌图,为含水材料表面分析提供一种简便、有效的方法。The microstructure of different kinds of pollen has been observed by using common high vac- uum scanning electron microscope. The observation condition is high vacuum, low voltage. The results show that the clear and true microstructure of the samples is got in the high vacuum environment, mean- while, there is no charge and drift phenomenon. The study provides a simple and effective surface analysis method for water-bearing materials.

关 键 词：高真空扫描电镜 低电压 显微结构 花粉 

分 类 号：Q944.571[生物学—植物学]