基于MCU和CPLD的微型动态应力存储测试系统  

Micro Dynamic Stress Storage Measurement System Based on MCU and CPLD

作　　者：张海龙[1,2] 马铁华[1,2] 谢锐[1,2] 刘双红[1,2] 

机构地区：[1]中北大学仪器科学与动态测试教育部重点实验室,太原030051 [2]中北大学电子测试技术国家重点实验室,太原030051

出　　处：《电子器件》2014年第1期123-126,共4页Chinese Journal of Electron Devices

摘　　要：为了解决车辆履带上的动态应变压力测试问题,设计了一套微型应力存储测试系统。对于应变压力传感器采用电桥法测试应力并应用存储测试技术设计了整套测试系统。使用单片机和CPLD作为系统的主控芯片完成系统的微功耗设计,并设计了模拟电路部分和数字电路部分。经过冲击梁实验表明此测试系统和理论计算的误差在7%以下,可以对车辆履带上的应力进行测量。A stress storage microsystem is introduced to slove the problem of Vehicle Track dynamic stress measurement. The bridge method is used to test stress signal collected by a strain type pressure transducer and storage testing technology is designed in this measurement system. With low loss MCU and CPLD as main chips low-power of the control system is realized. Analog circuit and digital circuits are designed,The cantilever-beam impact experiment show that experimental results differ,from theoritical calculation by less than 7%. So,this system can be adopted in stress measurements of Vehicle track.

关 键 词：应力 存储测试 微功耗 冲击粱 

分 类 号：TM93[电气工程—电力电子与电力传动]