空间CCD图像传感器辐射损伤评估方法  

The evaluation method of space radiation effects on space-borne CCD image sensors

作　　者：高欣[1,2] 杨生胜[1,2] 冯展祖[3,2] 张雷[3,2] 

机构地区：[1]真空低温技术与物理重点实验室 [2]兰州空间技术物理研究所,兰州730000 [3]空间环境材料行为与评价技术重点实验室

出　　处：《航天器环境工程》2013年第6期596-601,共6页Spacecraft Environment Engineering

基　　金："十二五"装备预先研究项目(编号:51311040301)

摘　　要：CCD图像传感器作为高灵敏度光电集成部件,易受空间辐射的影响而发生性能退化和工作异常。开展其辐射效应评价研究并制定相应的防护对策,是保证其在空间可靠应用的前提。文章通过地面模拟试验和辐射屏蔽计算,对空间用CCD图像传感器电离辐射损伤与位移损伤效应开展评估方法研究,为CCD抗辐射加固设计与地面评估试验提供参考。该方法也可用于其他光电器件和材料辐射效应评价。As a highly sensitive integrated optoelectronic component, the CCD image sensors are susceptible to space radiation damages, which would result in the performance degradation and anomalies of the CCD devices. It is a prerequisite for the reliable application in a space system to evaluate the radiation response of the CCD devices and to adopt corresponding radiation-hardness strategies. In this paper, an evaluation method by the ground simulation test and the calculation of the radiation shielding is proposed for the ionizing radiation damage and the displacement damage effects of the CCD devices, so that a reference method can be provided to deal with the radiation-hardness design and the on-ground evaluation experiments. The method can also be used to evaluate the radiation effects of other types of optoelectronic devices and materials.

关 键 词：电荷耦合器件(CCD) 空间辐射环境 辐射效应 电离总剂量 位移损伤剂量 辐射屏蔽 CCD(charge-coupled device) 

分 类 号：TN402[电子电信—微电子学与固体电子学] TN406