基于光泽分析的分光测色仪SCI误差修正模型  

Modified Model of Color Spectrophotometer SCI Condition Based on Gloss Analysis

作　　者：袁琨[1,2] 严惠民[1] 金尚忠[2] 

机构地区：[1]浙江大学国家光学仪器重点实验室,杭州310027 [2]中国计量学院光学与电子科技学院,杭州310018

出　　处：《光电工程》2014年第2期12-18,共7页Opto-Electronic Engineering

基　　金：国家重大科学仪器设备开发专项子课题(2011YQ 03012403)资助

摘　　要：在对相同材质,不同光泽的物体表面进行颜色测量时,为了去除表面光泽对颜色测量产生的影响,多选择漫射照明、8?观察角、包含镜面反射光的照明观测条件。在理想情况下,由于积分球对照明光线的匀化,测量结果不会受到材料表面光泽的影响。但是在实际仪器结构设计中,由于测量结构设计的限制导致相同光谱反射率,不同表面光泽的测试样品颜色测量结果不同。文章从理论上分析了漫射照明、8?观察角、包含镜面反射光的照明观测条件下不同光泽材料表面测量产生误差的原因,设计了一种可以同时测量颜色数据和光泽数据的测量结构,提出了一种根据被测材料表面光泽数据对SCI测量数据进行修正的矫正模型,并设计相关实验进行验证。实验结果证明,应用该矫正模型对测量结构进行修正可以显著减小该测量误差。When the surface color of the same material and different gloss objects is measured, in order to remove the color measurement impact caused by the surface gloss, the diffuse illumination, the viewing angle of 8-degree illumination and specular component included illumination viewing conditions are mostly chosen. Ideally, because of the homogenization effect of integrating sphere on illumination light, the measurement result is not affected by the surface gloss. However, in the real instrument design, owing to the constraints in measuring structural design, the color measurement results of the test samples with the same spectral reflectance and different surface gloss are different. This paper theoretically analyzes the cause of the deviation in the illumination viewing condition of the diffuse illumination, the viewing angle of 8-degree illumination and specular component included illumination, when measuring the material surface color of different gloss. This paper also designs a measurement structure which can simultaneously measure the data of color and gloss, presents a correction model which can modify the SCI measured data according to the surface gloss data of the test sample, and then designs relevant experiments to test and verify. The experimental results show that, using the correction model for modifying the measurement structure, the measurement error can be significantly reduced.

关 键 词：颜色测量 分光测色仪 光泽影响 算法修正 

分 类 号：O438.2[机械工程—光学工程]