一种表面发射率的测量方法研究  

Method for surface emissivity measurement

作　　者：刘连伟[1] 杨淼淼[1] 樊宏杰[1] 许振领[1] 姚梅[1] 

机构地区：[1]中国人民解放军63892部队

出　　处：《激光与红外》2014年第2期152-157,共6页Laser & Infrared

基　　金：总装预研基金(No.51303040203)资助

摘　　要：大型实验设备由于表面温度难以控制而使其表面发射率精确测量较为困难。在分析表面发射率测量误差主要来源的基础上,提出一种表面发射率工程测量方法。分析并推导了到达探测器上的辐射量,利用两发射率已知的设备,实现了环境辐射量的测量,从而消除了环境辐射对表面发射率测量的影响,有效提高了测量精度。设计了实验方法并进行了发射率测量实验,实验结果表明未考虑环境辐射的测量方法与该方法的计算结果相对误差可达20.37%,验证了该测量方法的可行性和准确性。It is difficult to accurately measure the large-scale equipment surface emissivity,because it is difficult tocontrol the temperature of the equipment.A method of emissivity measurement is proposed based on analyzing themain source of emissivity measurement errors.The radiation that reaches the detector is analyzed and derived,environ-mental IR radiation measurements are achieved by using two apparatus with known emissivity,thereby the environmen-tal radiation on the emissivity measurements effects is eliminated.Experimental method is designed and emissivitymeasurements experiment is made,analysis results show that,compared with the method of no considering the environ-mental radiation,there error is reduced by 20.37%.The method has feasibility and accuracy for engineering measure-ment of surface emissivity.

关 键 词：发射率 红外热像仪 环境辐射 

分 类 号：TN21[电子电信—物理电子学]