Mode characteristics of nano-width rectangle resonator  

作　　者：姚轲 冯国英 周寿桓 

机构地区：[1]Department of Opt-Electronics,Sichuan University [2]North China Research Institute of Electro-Optics

出　　处：《Chinese Optics Letters》2014年第2期63-68,共6页中国光学快报（英文版）

基　　金：supported by the Major Program of National Natural Science Foundation of China(No.60890200);the National Natural Science Foundation of China(No.10976017)

摘　　要：A new method based on Maxwell＇s equations,ABCD ray matrices,and total internal reflection is proposed to theoretically analyze the characteristics of eigenmodes confined in nano-width rectangle resonators.Using this method,mode wavelengths and indices of transverse and longitudinal modes are obtained.Another method based on the finite difference time domain technique and Pad′e approximation is used to numerically calculate resonant wavelengths,mode field distributions and quality factors.The results of two methods show that the resonant wavelengths obtained from both methods are very close,and the maximum relative error is less than 2%.The mode indices of transverse and longitudinal modes obtained agree well with mode field distribution patterns calculated by finite difference time domain techniques.A new method based on Maxwell＇s equations,ABCD ray matrices,and total internal reflection is proposed to theoretically analyze the characteristics of eigenmodes confined in nano-width rectangle resonators.Using this method,mode wavelengths and indices of transverse and longitudinal modes are obtained.Another method based on the finite difference time domain technique and Pad′e approximation is used to numerically calculate resonant wavelengths,mode field distributions and quality factors.The results of two methods show that the resonant wavelengths obtained from both methods are very close,and the maximum relative error is less than 2%.The mode indices of transverse and longitudinal modes obtained agree well with mode field distribution patterns calculated by finite difference time domain techniques.

关 键 词：Partial discharges Refractive index Time domain analysis 

分 类 号：TN629.1[电子电信—电路与系统] TN253