液冷计算机固体污染度检测研究  

Title： Research on test of the solid particle contamination level of the liquid cooled computer

作　　者：杨明明[1] 白振岳[1] 赵航[1] 董进喜[1] 

机构地区：[1]中航工业西安航空计算技术研究所,陕西西安710119

出　　处：《中国科技博览》2014年第4期530-531,共2页China Science and Technology Review

摘　　要：随着微电子技术的发展，芯片的功耗越来越高，计算机逐渐使用液体冷却技术解决其散热问题。固体颗粒污染物存在于计算机流体通道内部，这些污染物在冷却液流动过程中对会冲蚀计算机的流体通道甚至造成快速接头故障。为了减少固体污染物对液冷计算机的危害，应限制液冷计算机的固体颗粒污染度水平，以保证液冷计算机在某一污染度水平下能够正常工作。因此，准确测试液冷计算机的固体颗粒污染度指标就至关重要。本文对固体颗粒污染度分级标准、污染度检测方法和检测要求进行了介绍，最后提出了液冷计算机固体污染度的检测方法。With the development of the microelectmnics, the power of the chips becomes more and more serious, the technology of liquid cooled is beginning to be used in computer to solve the power dissipating of the chips. Solid particle contaminations exist in the liquid channels of the liquid cooled computer, the contaminations will corrode the liquid channels of liquid cooled computer and even make quick-disconnect malfunction. In order to reduce the harm done by the solid particle contamination to the liquid cooled computer, the solid particle contamination level should be limited to ensure liquid cooled computer will work normally at one solid particle contamination level. Thus,it＇s very important to test the solid particle contamination level of liquid cooled computer exactly. The standard,test methods and test requirements of the solid particle contamination level are introduced,and finally the solid particle contamination level of liquid cooled computer is presented in this paper.

关 键 词：液冷计算机 污染物 固体污染度 检测方法 

分 类 号：TP38[自动化与计算机技术—计算机系统结构]