专利计量视角下的我国纳米技术发展现状及趋势分析  

Chinese Nanotechnology Development Status and Trend Analysis Based on Patents Information Analysis

作　　者：费琳[1] 

机构地区：[1]江苏大学图书馆,江苏镇江212013

出　　处：《科技管理研究》2014年第5期105-109,共5页Science and Technology Management Research

摘　　要：为了解我国纳米技术发展现状,采用专利计量方法,对纳米技术专利申请的时间分布、技术领域分布、申请人分布、技术发展态势以及发展趋势进行分析。认为,我国纳米技术围绕着碳的制备等领域在快速发展的同时正在进行新一轮技术的储备;纳米技术目前主要处于科研阶段,高校与企业合作以促进成果转化问题应引起足够的重视;多数申请人还不具备较为全面的技术,需加强各具有不同技术和资源优势的申请人之间的合作,以提高我国纳米技术的整体全面提升。For exploring nanotechnology development status, the paper analyzes time, technology area and applicants distributions, and technology development status and development trend by applying patent metrology. The results show： （ 1 ） The patents application sum is increasing and technology is experiencing gestation period of adjustment. （2） C01B31/02 and some other technology areas are hot areas. Zhejiang university and some other universities are major application institutions. （3） C01B31/02 and other twelve areas will continue to increase. A61K35/78 and other five areas will decline. D01D5/00 and other three areas are seriously affected by external factors. Accordingly, the paper concludes that nanotechnology focusing on C01 B31/02 shows rapid development trend. Universities and companies should form comprehensive cooperation. And different applicants with different strength should cooperate to promote nanotechnology comprehensively.

关 键 词：专利计量 纳米技术 时间分布 技术领域分布 申请人分布 发展态势 发展趋势 

分 类 号：G306[文化科学] C18[社会学]