歧口凹陷内因低电阻率油气层饱和度定量评价方法  

On Quantitative Saturation Evaluation Method for Internal Cause Low Resistivity Reservoirs in Qikou Sag

作　　者：何伶[1,2] 丁娱娇 迟秀荣 李健 

机构地区：[1]长江大学地球物理与石油资源学院,湖北荆州434023 [2]中国石油勘探开发研究院,北京100083 [3]中国石油渤海钻探工程公司测井分公司,天津300280

出　　处：《测井技术》2014年第1期51-58,89,共9页Well Logging Technology

摘　　要：歧口凹陷碎屑岩储层中发育大量内因低电阻率油气层。埋深在2 500m以下的内因低电阻率油气层主要受黏土附加导电性和孔隙结构共同控制,埋深在2 500m以上的内因低电阻率油气层主要受复杂孔隙结构引起的高束缚水饱和度控制。饱和度定量计算公式中的关键参数m、n值与低电阻率油气层主控因素关系密切;对黏土矿物附加导电型低电阻率油气层其阳离子交换容量、孔隙结构和地层水矿化度是控制m、n变化的3个最重要因素;岩性细、高束缚水饱和度型低电阻率油气层其孔隙结构、地层水矿化度是控制m、n变化的2个最重要因素。针对以上2种内因低电阻率油气层类型分别建立了相应的m、n值计算方法,实现了连续可变m、n值的低电阻率油层饱和度定量计算。A large number of internal cause low resistivity oil and gas layer exist in Qikou sag clastic reservoirs, where reservoir burial depth less than 2 500 m, internal cause low resistivity layers are mainly controlled by the additional conductivity of clay and pore structure, reservoir burial depth exceeds 2 500 m, internal low resistivity layers are mainly controlled by high bound water saturation caused by the complex pore structure. The key parameters m, n values of quantitative saturation calcualation formula have close relation with the main controlling factors of low resistivity reservoirs. For clay minerals additional conductive layer of low resistivity layer, cation exchange capacity, pore structure and formation water salinity are the three most important factors which control m,n parameter changes, for low resistivity layer with fine rock and high irreducible water saturation, pore structure and formation water salinity are the two most important factors which control m, n parameter changes. Based on the above two internal cause low resistivity layers, we established corresponding rn,n value calculation method that can quantitatively calculate low resistivity reservoir saturation with continuously variable m, n values.

关 键 词：测井解释 低电阻率油层 饱和度 阳离子交换容量 孔隙结构 歧口凹陷 

分 类 号：P631.84[天文地球—地质矿产勘探]