二元光学元件分析方法概述  

Generalization of Aanalysis Methods for Binary Optical Elements

作　　者：陈彩花[1] 

机构地区：[1]长春光学精密机械学院电子与信息工程分院

出　　处：《长春光学精密机械学院学报》2000年第3期58-63,共6页Journal of Changchun Institute of Optics and Fine Mechanics

摘　　要：作为 90年代的光学 ,二元光学具有广泛的应用前景。根据元件特征尺寸及观察衍射场离衍射元件的远近 ,二元光学元件的分析方法有两种 ,标量衍射分析法和矢量衍射分析法。本文详细介绍了两种方法及其具体应用范围 。As one of new technologies, binary optics has an extended future of application. According to different feature sizes and distances from the element’s surface to the observation point ,the analysis methods for binary optical elements can be classified into two categories ,the scalar diffraction analysis methods and the vector diffraction analysis methods . This paper introduces these methods and their actual application scopes in detail. At last, we summarize them and their subordinate methods by use of a diagram.

关 键 词：标量衍射分析法 矢量衍射分析法 二元光学元件 

分 类 号：O436.1[机械工程—光学工程]