一种用于X射线工业检测的多通道电荷读出IC  

A Multi-Channel Charge Readout IC for X-ray Industrial Inspection

作　　者：王旭[1,2] 杨洪艳[1] 袁颖[1] 吴武臣[1] 

机构地区：[1]北京工业大学VLSI与系统研究室,北京100022 [2]北京地太科特电子技术有限公司,北京100102

出　　处：《微电子学》2014年第1期28-33,共6页Microelectronics

基　　金：国家自然科学基金资助项目"低功耗集成多级放大器的设计研究"(60976028)

摘　　要：介绍了一种用于X射线工业检测的多通道电荷读出IC。该电荷读出IC可提供64个通道,将探测器电荷转换成模拟电压。电路由电荷放大器增益控制、增益电容阵列、时序发生器、移位寄存器链、电荷放大器阵列和采样保持放大器等组成,具有低噪声、14位动态范围等特性。电路芯片采用0.8μm标准CMOS工艺制造,芯片尺寸为3.1mm×10.9mm。电路在3.3MHz频率、5V电源电压和3.5V参考电压下工作,电路功耗为45mW。测试结果表明,在电荷放大器增益电容为0.5pF和光电二极管结电容为33pF下,电路的输出噪声达到600μV(Vrms)。A multi-channel charge readout IC for X-ray industrial inspection was presented, which converted detector charge into analog voltage in 64 channels. The charge readout IC, which featured low noise and 14 bit dynamic range, was comprised of charge amplifier gain control, gain capacitor array, timing generator, shift register chain, charge amplifier array and sample/hold （S/H） amplifier. The charge readout IC, which occupied a die area of 3. 1 mm × 10. 9 mm, was fabricated in 0. 8 μm standard CMOS process. The circuit operated at 3. 3 MHz, and consumed 45 mW from 5 V supply and 3.5 V voltage reference. Test results showed that the circuit had an output noise of 600 μV （Vmns） for charge amplifier gain capacitance of 0. 5 pF and photodiode terminal capacitance of 33 pF.

关 键 词：多通道电荷读出集成电路 低噪声 动态范围 X射线工业检测 

分 类 号：TN432[电子电信—微电子学与固体电子学]