斜向探测电离图描迹提取算法研究  

Algorithm Study of Trace Extraction from Oblique Ionogram

作　　者：张成峰[1] 王昶[1] 刘子龙[1] 朱启强[1] 

机构地区：[1]中国电波传播研究所青岛分所,山东青岛266107

出　　处：《中国电子科学研究院学报》2014年第1期85-88,共4页Journal of China Academy of Electronics and Information Technology

基　　金：国家自然科学基金(61032011;61331012;61302006)

摘　　要：电离层斜向探测工作在高频段,密集的外部干扰如短波通信,广播电台以及大气噪声等污染了接收数据,严重影响斜向探测电离图描迹的提取。针对上述问题,本文提出了一种提取斜向探测电离图描迹的算法。该算法由频域去干扰,有序统计量OS-CFAR检测,去虚警点三个步骤构成。对实测数据的处理结果表明这种方法的有效性和实用性。Oblique sounding of ionosphere works in high frequency band. The external dense interfer- ences in the HF band, such as shortwave communication, broadcast, air noise and so on, contaminate the received data, affect the trace extraction from oblique ionogram. Aiming at these problems above, a method of trace extraction from oblique ionogram is proposed. The method is composed of three steps. Firstly, it suppresses interference in frequency domain, and then it extracts signal by OS-CFAR method, finally it removes false signal by digital image process method. The method is applied to the measured da- ta, and results show that the proposed method is efficient and practical.

关 键 词：斜向探测电离图 描迹提取 有序统计量检测 

分 类 号：TN011.2[电子电信—物理电子学]