对Si(Li)探测器测谱中产生伪峰现象的分析  

ANALYZING THE PHENOMENA OF FAKE PEAK PRODUCED IN Si(Li) DETECTOR’S MEASURING SPECTRUM

作　　者：张开春[1] 吴丽萍[1] 周厚全[1] 李志勇[2] 

机构地区：[1]四川大学物理系,成都610064 [2]北京核仪器厂,北京100020

出　　处：《四川大学学报（自然科学版）》2001年第1期115-117,共3页Journal of Sichuan University(Natural Science Edition)

摘　　要：The Be window is destroyed by chance during using the Si(Li) detector.After it is repaired,the detector is used to measure characteristic X ray of following elements of V,Fe,Ni,Cu,Zn and Pb.The concomitent fake peak appears going with the photoelectric peak of above mentioned elements,and the ratio of two peaks’ energy is nearly a constant.By experiment test and reason analysis,it is found that the fare peak is resulted from Li ions’ contrary diraction drift in Si(Li) detector,which is caused by the suddenly sharp change of outward the degree of vacuum and high voltage.The Be window is destroyed by chance during using the Si(Li) detector.After it is repaired,the detector is used to measure characteristic X ray of following elements of V,Fe,Ni,Cu,Zn and Pb.The concomitent fake peak appears going with the photoelectric peak of above mentioned elements,and the ratio of two peaks’ energy is nearly a constant.By experiment test and reason analysis,it is found that the fare peak is resulted from Li ions’ contrary diraction drift in Si(Li) detector,which is caused by the suddenly sharp change of outward the degree of vacuum and high voltage.

关 键 词：硅 锂 探测器 测谱 伪峰现象 

分 类 号：TL814[核科学技术—核技术及应用]