基于Berreman矩阵研究一维掺有各向异性材料缺陷的光子晶体偏振特性  

Polarization properties of one-dimensional photonic crystal doped anisotropic material based on Berreman matrix

作　　者：卢礼萍[1,2] 魏良淑[2] 骆晓森[1] 倪晓武[1] 陆建[1] 

机构地区：[1]南京理工大学理学院 [2]南京农业大学理学院

出　　处：《红外与激光工程》2014年第3期828-832,共5页Infrared and Laser Engineering

基　　金：国家自然科学基金(11174151);南京农业大学青年科技创新基金(KJ2010028)

摘　　要：为了研究具有各向异性材料缺陷层的光子晶体禁带特性，构造了具有各向异性材料缺陷层（AB）10F（BA）10型一维光子晶体，利用Berreman传输矩阵进行了数值计算。研究发现，随着缺陷层F厚度d的增加，在700~1000 nm禁带中出现的两个缺陷模发生红移，缺陷模透射系数呈阶段性变化。改变缺陷层内单轴晶体方位角θ，X偏振光产生的缺陷模往长波方向移动，透射系数在一定波长范围内规律变化，而Y偏振光产生的缺陷模始终不变。另方位角φ在0~90＆#176;范围内变化，则该禁带内产生新的缺陷模。缺陷模的这些特征对全方位过滤器的设计有一定价值。In order to study the band gap characteristics of photonic crystal doped anisotropic material,an （AB）10F（BA）10 symmetrically structured one-dimensional photonic crystal was designed and its transmission coefficient was numerical calculated by Berreman transmission matrix. It is found that the two defect modes in the 700-1 000 nm photonic band gap exhibits red shift and their transmission coefficient changes periodically with the increase of thickness of the defect layer F. When changing the azimuthal angle θ!of the uniaxial crystal in F, the defect mode generated by X polarized light moves toward long-wavelength direction and its transmission coefficient changes regularly. But the one generated by Y polarized light has no change. When increasing the φduring 0-90°, a new defect mode appears. These properties of defect modes are of significance in application of filter design.

关 键 词：光子晶体 缺陷模 Berreman矩阵 单轴晶体 透射率 

分 类 号：O436[机械工程—光学工程]