基于微控制器的嵌入式边界扫描解决方案  

Embedded Boundary—scan Solution Based on MCU

作　　者：杜影[1] 李洋[1] 徐鹏程[1] 王石记[1] 安佰岳[1] 郑义[1] 

机构地区：[1]北京航天测控技术有限公司,北京100041

出　　处：《计算机测量与控制》2014年第3期686-689,共4页Computer Measurement &Control

基　　金：总装备部预研项目(51317040204)

摘　　要：为了解决电路板快速诊断维修问题,嵌入式测试正以全新的概念成为板级电路测试的研究方向;嵌入式测试性设计,是将自动故障检测和诊断功能内置于电路板中,利用嵌入式测试控制器,在UUT内部实现故障检测;边界扫描技术作为高密度电路板故障检测的主流技术,将结合嵌人式测试方法,成为板级乃至系统级故障检测的新发展方向;文章首先概述了嵌入式边界扫描技术,然后提出了一种基于微控制器的嵌入式边界扫描解决方案,阐述了嵌入式边界扫描的数据生成技术,最后以数字IO电路板为对象进行了测试性设计与验证,并给出结论;总体上,嵌入式测试以增强测试自动化、提高测试覆盖率和测试效率为目的,能够更好地降低产品整个寿命周期的测试维修成本。To solve the problems of fast diagnosis and maintenance on circuit board, the embedded test as a new concept has becoming a research direction. The central place that the embedded test suggests that the UUT （Unit Under Test） with inner embedded test controller has functions of automatic fault detection and diagnosis. Boundary--scan technology which has become a mainstream option in high--density circuit board fault detection will band together with embedded test technology. It is the new direction of DFT development. In this paper, the embedded boundary--scan technology is introduced firstly. Then a embedded boundary--scan solution based on MCU is offered. And the embedded boundary--scan TPG （test pattern generation） is introduced. At last, the design and verification of embedded boundary--scan targeted at the digital IO circuit are presented. In a word, the embedded test is used to improve the test automation, the test coverage and the test efficiency. It can decrease the life cycle cost of test and maintenance greatly.

关 键 词：嵌入式测试 可测性 边界扫描 微控制器 

分 类 号：TM57[电气工程—电器]