基于模拟IC测试的任意波形发生器设计与实现  

Design and implementation of arbitrary wave generator based on analog IC test

作　　者：陈芳[1] 

机构地区：[1]电子科技大学微电子与固体电子学院

出　　处：《电子设计工程》2014年第6期85-88,共4页Electronic Design Engineering

摘　　要：面向模拟IC自动测试仪设计并实现了一种由FPGA控制的任意波形发生器。设计采用闭环控制的方法,保证任意波形发生器输出信号的高精度。任意波形发生器波形数据存储深度最大可达128 MB,采样精度为16位,最高采样率可达到160 MHz,输出信号频率为1 Hz^1 MHz,峰峰值范围为20 mV^20 V,幅度偏置范围为±2.5 V,精度可达到±0.1 dB。实际测试表明该设计满足模拟IC测试仪的项目要求。In order to satisfy the requirement of the analog IC tester,the Arbitrary Wave Generator（AWG） controlled by FPGA is designed and implemented in this paper.To guarantee the high accuracy of AWG,this design adopts a closed-loop control method.The waveform data storage depth of AWG is up to 128 MB,the sampling precision is 16 bits,highest sampling rate can be up to 160 MHz,the output signal frequency ranges from 1 Hz ～1 MHz,the peak-peak value range is 20 mV～20 V,amphtude offset range is ±2.5 V,amplitude precision can reach ±0.1 dB.Actual test result shows that this design can satisfy the demands of analog IC tester.

关 键 词：模拟IC测试仪 任意波形发生 数模转换器 FPGA 

分 类 号：TN47[电子电信—微电子学与固体电子学]