激光等离子体X射线背光源诊断研究  

Diagnosis of X-Ray Backlighter Based on Laser Plasma

作　　者：王洪建[1,2] 肖沙里[3] 叶雁[1] 王海容[1,3] 李泽仁[1] 

机构地区：[1]中国工程物理研究院流体物理研究所,四川绵阳621900 [2]重庆工商大学重庆市发展信息管理工程技术研究中心,重庆400067 [3]重庆大学光电技术及系统教育部重点实验室,重庆400030

出　　处：《中国激光》2014年第3期225-229,共5页Chinese Journal of Lasers

基　　金：国家863计划(2012AA8041070B);强场激光物理国家重点实验室开放项目;重庆市教委科学技术研究项目(KJ120710,KJTD20313);重庆工商大学青年基金

摘　　要：为诊断激光驱动金属靶产生X射线背光源的性能，利用椭圆聚焦特性，研制了一种背光椭圆晶体谱仪。谱仪的色散分析元件为云母（002）晶体，椭圆弯晶的焦距为1350mm，离心率为0．9586。激光束以30°角斜入射背光薄靶，且与椭圆弯晶长轴方向垂直。背光椭圆弯晶谱仪的布拉格入射角为50°～67°，衍射探测角为100°～120°，探测的波长为0．14～0．16nm，采用X射线CCD相机接收信号。利用神光Ⅱ激光装置7#和8#激光器同时聚焦轰击10μm厚的Cu平面背光薄靶，CCD成功获取了Cu等离子体X射线的类氦和Ka谱线。经解谱发现谱线有明显基底，用最小二乘法差值去噪处理后，实测谱线分辨率（λ／△λ）大于700。To study the characteristics of X-ray backlighter generated by laser irradiating a foil, a backlit elliptically bent crystal spectrometer is developed based on the ellipse focusing theory. The elliptical mica （002） crystal is employed with 1350 mm focal length, 0. 9586 eccentricity and 50°-67° Bragg angle. The laser is of 30° incident angle and perpendicular to long axis of elliptical mica. Diffraction detecting angle is 100°- 120° and the wavelength is 0.14-0.16 nm. X-ray CCD is taken as the signal detector. The experiment is carried out on SG Ⅱ where the 7 and 8 # lasers irradiate 10 μm Cu foil simultaneously. CCD obtains the X-ray spectral information of the similar helium and Ka spectra of Cu plasma X-ray. It is demonstrated by spectrum unfolding that spectral lines have obvious basement, and the spectral resolution is over 700 after difference denoising with the least square method.

关 键 词：光谱学 等离子体光谱学 椭圆弯晶谱仪 神光Ⅱ 激光等离子体 X射线背光源 

分 类 号：O536[理学—等离子体物理] O432[理学—物理]