聚酰亚胺薄膜表面电荷的开尔文力显微镜研究  

Research on Surface Charges of Polyimide Films by the Kelvin Force Microscope

作　　者：孙志[1] 王暄[1] 韩柏[1] 雷清泉[1] 

机构地区：[1]黑龙江省电介质工程国家重点实验室培育基地(哈尔滨理工大学),黑龙江省哈尔滨市150080

出　　处：《中国电机工程学报》2014年第12期1957-1964,共8页Proceedings of the CSEE

基　　金：国家重点基础研究发展计划项目(973计划)(2012CB 723308);国家自然科学基金青年项目(51307037);黑龙江省自然科学基金项目(QC2013C042)~~

摘　　要：为在微纳米尺度下研究无机纳米掺杂对聚酰亚胺表面电荷特性的影响，采用开尔文力显微镜测量了杜邦公司生产的原始聚酰亚胺薄膜和纳米掺杂耐电晕聚酰亚胺薄膜二种材料，在被导电微探针注入电荷后的表面电荷发生、发展特性。实验发现，在相同的电荷注入条件下，耐电晕薄膜上表面电荷积累量约为原始聚酰亚胺薄膜上电荷积累量的50％；耐电晕薄膜上电荷消散速度较快，约为原始聚酰亚胺薄膜上的4～5倍。分析可知，耐电晕薄膜由于掺杂了纳米颗粒Al2O3，使得薄膜的注入势垒增大、电阻率减小，这些因素减少了耐电晕薄膜表面电荷的积累，避免了局部电场畸变，进而增强了材料的耐电晕特性。To investigate the effect of inorganic nanoparticles on the surface charge properties ofpolyimide （PI） at the micro/nano scale, the measurement on surface charge was carried out with both the original PI film and nano-Al2O3 filled corona-resisting PI film by Kelvin Force Microscope （KFM）. Experimental results show that： the surface charge accumulation on corona-resisting PI film under the same constraints reduced to 50% of that on original PI film, and charge dissipate quickly for the corona-resisting PI film. Time constant of exponential decay on original PI is four to five times to the corona-resisting PI. It could be deduced from above results that due to doping of Al2O3 made the injection barrier increases and the resistivity decreases for corona-resisting PI film than original PI fill. These factors lead to reduce the surface charge accumulation and avoid distortion of local electric field. Hence, the corona resistant performance is enhanced.

关 键 词：聚酰亚胺 开尔文力显微镜 表面电荷 纳米杂化 耐电晕 

分 类 号：TM211[一般工业技术—材料科学与工程]