非BS器件的模型化分类测试  

Research on Non-boundary Scan Devices' s Test Method Based on Modeling and Classification

作　　者：钟春丽 张平[1] 生拥宏[1] 王炜[1] 朱毅[1] 

机构地区：[1]解放军信息工程大学,郑州450002

出　　处：《小型微型计算机系统》2014年第4期889-894,共6页Journal of Chinese Computer Systems

基　　金：未来发展基金项目(1201)资助;国家″八六三″目标导向项目(2009AA01Z434)资助

摘　　要：针对现有电路板边界扫描器件与非边界扫描器件同时存在,致使测试覆盖率较低的问题,提出对非BS器件模型化分类的测试方法.以器件的可测属性为依据,对其进行分类并抽象建模.将板上器件及线网抽象为有向图,基于迪杰斯特拉算法及广度优先搜索算法,构建了电路板的可达测试模型.对可达测试模型和簇测试模型的生成方法进行了形式化定义,并给出模型的测试方案.实验结果表明,该方法比现有簇测试方法测试覆盖率更高,进一步扩展了板上非BS器件的可测范围,并能很好的应用于自动测试.The coverage of the circuit board test is low, with boundary scan devices and non-boundary scan devices on which. A Non- Boundary Scan devices＇s test method based on modeling and classification is proposed to solve this problem. Based on measurable at- tributes of devices, the on-board-device is modeled and classifed. Abstracting devices and wire as a digraph, a kind of reachability test model of the circuit board is established based on the Dijkstra algorithm and breadth-first search algorithm. A formal definition of method to generate reachable test models and cluster test model is Conducted, along with the test program. Experimental results show that this method improves the test coverage of circuit board with non- Boundary Scan devices, and can be well applied to automated testing.

关 键 词：边界扫描测试技术 模型化 有向图 非BS器件 自动测试 

分 类 号：TP301[自动化与计算机技术—计算机系统结构]