聚合物球凹阵列的密度调控及其镀金后的SERS性能  

Surface Density controlling of polymer voids array and the SERS performance after gold deposition

作　　者：孙春生 洪清华 刘雪锋 

机构地区：[1]江南大学化学与材料工程学院,江苏无锡214122

出　　处：《化学研究与应用》2014年第4期541-545,共5页Chemical Research and Application

基　　金：国家自然科学基金项目(21071065)资助;教育部基金项目(教外司留[2011]1139)资助

摘　　要：以内嵌于聚合物呈非紧密接触堆积的SiO2微球阵列为模板,经HF蚀除表层SiO2微球后再经金属物理覆镀,得到81 cm2/片的球凹阵列SERS基底。以苯硫酚为探针,所得阵列的SERS效应显著(EF高达108量级),并且重现性良好(EF的RSD<8%);将SiO2与聚合物的体积比(RS-P)在20%-42%范围内改变,基底表面球凹均可保持六边形周期性排布,球凹的排布密度(Γ)在4.65×108个/cm2-6.92×108个/cm2范围内相应改变。Periodic voids arrays for surface-enhanced Raman scattering（ SERS） have been fabricated,by which the multilayer silica colloidal crystal-polymer composites with an unusual non-close-packed structure were utilized as the structural templates. Uniform voids array over wafer-sized areas（81 cm^2）can be reproducibly obtained by a brief HF etching-off colloidal silica in the outer layer of the templates and then surface metal deposition. The SERS enhancement factor（ EF） of the resulting voids array reaches into 10^8 orders of magnitude and the relative standard deviation （ RSD ） of EF is less than 8% utilizing benzenethiol as the Raman probe. Surface density（Γ）of voids can be controlled easily by adjusting the volume ratio（RS-P）of silica and polymer. The unique hexagonal patterning of voids is unchangeable in the RS-P range of 20%to 42%,accordingly,the value ofΓchanges from 4. 65×10^8 voids/cm^2 to 6. 92×10^8 voids/cm^2.

关 键 词：球凹阵列 密度调控 SERS性能 重现性 

分 类 号：O611.4[理学—无机化学]