由测量回路接触不良引起介损偏大的分析  

Analysis on Larger Dielectric Loss Caused by Poor Contact in Measuring Circuit

作　　者：程扬军 黄堃 庄伟 

机构地区：[1]福建省永安市供电有限公司,福建三明366000

出　　处：《电力电容器与无功补偿》2014年第2期78-81,共4页Power Capacitor & Reactive Power Compensation

摘　　要：本文重点阐述测量回路接触不良对套管介损测量的影响。实例中介绍了变压器套管内部结构,并画出其等效电路图,在排除多种影响套管介损测量的因素后,通过对变压器套管中等电位销锈蚀引起的附加电阻加以向量分析,找出套管介损超标的真正原因,对比套管检修前后的试验数据阐明了测试回路的接触情况对于准确测量套管介损的重要性,最后,对变压器套管检修提出了几点建议。In this paper, the influence of poor contact of measurement circuit on dielectric loss is mainly described. Internal structure of transformer bushing is introduced by example and its equivalent electrical diagram is drawn. After eliminating various factors affecting dielectric loss measurement of bushing, through vector analysis of the additional resistance caused by the rusting of potential pin in the transformer bushing, the real reason for dielectric loss exceeding is found. Through comparing the test data before and after the course of bushing＇ s maintenance, the importance of test circuit contact for accurate measurement of dielectric loss is presented, and finally, some suggestions on maintenance of transformer bushing are made.

关 键 词：接触不良 套管 介损测量 附加电阻 

分 类 号：TM216.5[一般工业技术—材料科学与工程]