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出 处:《Chinese Physics B》2014年第5期283-286,共4页中国物理B(英文版)
基 金:Project supported by the Fundamental Research Funds for the Central Universities of China;the Special Prophase Project on the National Basic Research Program of China(Grant No.2011CB311807);the National Basic Research Program of China(Grant No.2010CB923102);the National Natural ScienceFoundation of China(Grant Nos.11004158,11074198,and 11074199)
摘 要:The fourier-transform patterns of an object are usually observed in the far-field region or obtained in the near-field region with the help of lenses. Here we propose and experimentally demonstrate a scheme of Fourier-transform patterns in the Fresnel diffraction region with thermal light. In this scheme, neither a lens nor a bearnsplitter is used, and only one single charge coupled device (CCD) is employed. It means that dividing one beam out of a light source into signal and reference beams is not as necessary as the one done by the use of a beamsplitter in usual ghost interference experiments. Moreover, the coincidence measurement of two point detectors is not necessary and data recorded on a single CCD are sufficient for reconstructing the ghost diffraction patterns. The feature of the scheme promises a great potential application in the fields of X-ray and neutron diffraction imaging processes.The fourier-transform patterns of an object are usually observed in the far-field region or obtained in the near-field region with the help of lenses. Here we propose and experimentally demonstrate a scheme of Fourier-transform patterns in the Fresnel diffraction region with thermal light. In this scheme, neither a lens nor a bearnsplitter is used, and only one single charge coupled device (CCD) is employed. It means that dividing one beam out of a light source into signal and reference beams is not as necessary as the one done by the use of a beamsplitter in usual ghost interference experiments. Moreover, the coincidence measurement of two point detectors is not necessary and data recorded on a single CCD are sufficient for reconstructing the ghost diffraction patterns. The feature of the scheme promises a great potential application in the fields of X-ray and neutron diffraction imaging processes.
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