非对称衍射法测量反极图  

Measurement of Inverse Pole Figure by Asymmetric X-Ray Diffraction Method

作　　者：周顺兵[1] 冯大军[1] 姚中海[1] 

机构地区：[1]武汉钢铁(集团)公司研究院,武汉430080

出　　处：《电工材料》2014年第1期36-38,共3页Electrical Engineering Materials

摘　　要：介绍了一种在X-射线衍射仪上采用非对称衍射方式测量反极图的方法。该方法的特点是:与对称衍射方式相比,非对称衍射方式测量的反极图中的极密度的大小既包含了在对称衍射方式下能产生衍射的晶粒对极密度的贡献,也包含了与对称衍射晶粒有一定取向差的晶粒对极密度的贡献,因而采用该方法测量反极图更科学,所测结果更接近真值。A method for measuring the inverse pole figure with an asymmetric diffraction manner by X-ray diffractometer is introduced. Compared with the symmetric diffraction manner, the pole density of the inverse pole figure measured by asymmetric diffraction method contains the contribu-tions from both the crystal grains generating diffraction in the symmetric diffraction manner and the crystal grains having an orientation difference with the above mentioned symmetric diffraction grains. Through the method introduced in this paper, a more scientific inverse pole figure and more true results can be obtained.

关 键 词：X-射线衍射仪 非对称衍射 反极图 

分 类 号：TG115.22[金属学及工艺—物理冶金]