Experimental measurements and theoretical calculations of the atomic structure of materials with subangstrom resolution and picometer precision  

作　　者：Jing Zhu Rong Yu 

机构地区：[1]Beijing National Center for Electron Microscopy, Key Laboratory of Advanced Materials of Ministry of Education of China and State Key Laboratory of New Ceramics and Fine Processing, School of Materials Science and Engineering, Tsinghua University

出　　处：《Chinese Science Bulletin》2014年第15期1719-1724,共6页

基　　金：supported by the National Basic Research Program of China(2009CB623701,2011CB606406);the National Natural Science Foundation of China(51371102,51390475,51071092,11374174,and 51390471);the Foundation for the Author of National Excellent Doctoral Dissertation of China;the Program for New Century Excellent Talents in University;the Scientific Foundation for Returned Overseas Chinese Scholars,Ministry of Education

摘　　要：Lattice defects are unavoidable structural units in materials and play an important role in determining material properties.Compared with the periodic structure of crystals,the atomic configurations of the lattice defects are determined by the coordinates of a large number of atoms,making it difficult to experimentally investigate them.In computational materials science,multiparameter optimization is also a difficult problem and experimental verification is usually required to determine the possibility of obtaining the structure and properties predicted by calculations.Using our recent studies on oxide surfaces as examples,we introduce the method of integrated aberration-corrected electron microscopy and the first-principles calculations to analyze the atomic structure of lattice defects.The atomic configurations of defects were measured using quantitative high-resolution electron microscopy at subangstrom resolution and picometer precision,and then the electronic structure and dynamic behavior of materials can be studied at the atomic scale using the firstprinciples calculations.The two methods complement each other and can be combined to increase the understanding of the atomic structure of materials in both the time and space dimensions,which will benefit materials design at the atomic scale.Lattice defects are unavoidable structural units in materials and play an important role in determining material properties. Compared with the periodic structure of crystals, the atomic configurations of the lattice defects are determined by the coordinates of a large number of atoms, making it difficult to experimentally investigate them. In computational materials science, multiparameter optimization is also a difficult problem and experimental verification is usually required to determine the possibility of obtaining the structure and properties predicted by cal- culations. Using our recent studies on oxide surfaces as examples, we introduce the method of integrated aberra- tion-corrected electron microscopy and the first-principles calculations to analyze the atomic structure of lattice defects. The atomic configurations of defects were mea- sured using quantitative high-resolution electron micros- copy at subangstrom resolution and picometer precision, and then the electronic structure and dynamic behavior of materials can be studied at the atomic scale using the first- principles calculations. The two methods complement each other and can be combined to increase the understanding of the atomic structure of materials in both the time and space dimensions, which will benefit materials design at the atomic scale.

关 键 词：材料性能 原子结构 计算材料学 实验测量 分辨率 皮米 高分辨电子显微镜 电子显微镜分析 

分 类 号：TB303[一般工业技术—材料科学与工程]