电感耦合等离子体原子发射光谱法测定钽钨合金中的钨  

Determination of Tungsten in Tantalum Tungsten Alloy by ICP-AES

作　　者：张丹莉[1] 禄妮[1] 孙宝莲[1] 李波[1] 

机构地区：[1]西北有色金属研究院材料分析中心,西安710016

出　　处：《西安文理学院学报（自然科学版）》2014年第2期91-93,共3页Journal of Xi’an University(Natural Science Edition)

摘　　要：采用电感耦合等离子体原子发射光谱法（ICP-AES）测定了Ta1oW合金中的钨量,样品用硝酸和氢氟酸溶解,在波长207.911 nm下测定,采用高纯钽进行基体匹配绘制校准曲线以消除基体干扰,加标回收率介于96％～101％,RSD小于0.38％.该方法简便快速,结果准确,可用于生产检验和标准样品检测.The determination of tungsten in tantalum tungsten is very difficult in chemical anal- ysis. With its convenience and rapidity, the ICP-AES analysis has become a common method in determining tungsten in tungsten alloy. This paper proposes an ICP-AES method for the de- termination of tungsten in tantalum tungsten alloy. The optimum analytical conditions and the working parameters of the instrument were studied. The matrix matching method was used to e- liminate matrix effects, i. e., a definite amount of tantalum was added to test solutions in prepa- ration of calibration curve. The recoveries were from 96% to 101%, and the RSD 〈0.38%. This method has proven to be convenient, rapid and suitable for production inspection and standard sample analysis.

关 键 词：ICP-AES 钽钨合金 钨 

分 类 号：TG146.41[一般工业技术—材料科学与工程]