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作 者:蒲亚芳
机构地区:[1]陕西华经微电子股份有限公司,陕西西安710065
出 处:《现代电子技术》2014年第6期155-157,162,共4页Modern Electronics Technique
摘 要:对于技术指标不多、形状规则的电路模块,采用常规的测试夹具和测量仪器就可以达到测试要求。但对于技术指标繁多,测试过程复杂的专用电路模块,利用常规的测试方法,工作效率低下,而且会出现因电源线的极性接反而烧坏产品的现象。因此,设计制作了专用的测试台。根据专用电路模块技术指标的要求,确定了测试台的设计方案。通过测试方法的详细说明,体现了该测试台对技术指标测试的全面性,达到了测试目的,解决了专用电路模块的生产瓶颈,大大提高了工作效率。In general,the circuit modules with a few of specifications and regular shapes can be tested by common test fix-ture and measuring instruments to meet the test requirement. However,as for the special circuit modules with many specifica-tions and complicated test process have been tested,the routine test approaches may cause low efficient and even worse result ofproduct burnout. Therefore,a special test stand was designed. According to the requirements of circuit module specifications,the design solution of the special test stand was confirmed. The performance of the test stand was demonstrated by detailed de-scription of test procedure. Test stand made a great deal of contribution to the bottleneck in its production and improved the pro-duction efficiency dramatically.
分 类 号:TN911-34[电子电信—通信与信息系统]
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