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作 者:孙上鹏[1,2] 赵会兵[2] 陈德旺[1] 全宏宇 宁滨[1]
机构地区:[1]北京交通大学轨道交通控制与安全国家重点实验室,北京100044 [2]北京交通大学电子信息工程学院,北京100044
出 处:《铁道学报》2014年第3期31-36,共6页Journal of the China Railway Society
基 金:铁道部科技研究开发计划(2012X004-C);北京市科技新星计划(2010B015);教育部基本科研业务费(2012JBM016)
摘 要:轨道电路中,分路电阻主要由在轨道上走行车辆的轮对自身材料的电阻和轮轨接触电阻构成。分路不良可严重影响铁路运输的安全和效率,而分路电阻过高是导致分路不良的主要原因。本文基于电接触理论对轮轨接触表面进行分析,提出一种轨道电路分路电阻的计算方法,并对其变化规律及影响因素进行定量分析。实验结果表明,轮对的材料电阻通常比轮轨接触电阻小得多,因此实际分路电阻可近似为轮轨接触电阻。轮轨接触电阻主要受轮轨间存在的污染膜层的影响,加强对污染膜层特性的研究,对消除分路不良现象有重要的意义。Shunt malfunction is risky in application of track circuits of railways,which may lead to serious ad-verse effect on railway transport safety and efficiency.The main cause of shunt malfunction is that the shunt resistance goes too high.The shunt resistance consists of the material resistance of the wheelset and the contact resistance between wheel and rail.In the paper,an estimation-theoretic approach to shunt resistances was made by the electrical contact theory.With the proposed method for calculation of shunt resistances,quantitative in-vestigations into the changing law and influencing factors of shunt resistances were carried out.Experiment re-sults show as follows:The wheel-set material resistance is far less than the wheel-rail contact resistance,the shunt resistance can be approximated to the wheel-rail contact resistance;the contaminant film between wheel and rail governs the wheel-rail contact resistance,so further strengthened research on the contaminant film is of quite important significance to elimination of the shunt malfunction.
分 类 号:U284.22[交通运输工程—交通信息工程及控制]
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