X荧光光谱法测试地质样品中的锡  

Determination of Tin in Geological Samples by X-ray Fluorescence Spectrometry

作　　者：赵恩好[1] 岳明新[2] 周国兴[2] 

机构地区：[1]吉林大学地球科学学院,吉林长春130026 [2]沈阳地质矿产研究所,辽宁沈阳110032

出　　处：《当代化工》2014年第4期634-635,638,共3页Contemporary Chemical Industry

摘　　要：采用X射线荧光光谱压片法对地质样品中Sn进行测试,通过人工配置标准样品和国家标准样品共同建立标准曲线,曲线梯度合理均匀,线性良好。该方法采用α经验系数法进行基体校正,采用Rh的康普顿散射作内标,对于地质样品中Sn元素的测试,检出限可达到3.59μg/g,样品的相对标准偏差可达到3.1%,测试效果理想。Sn in geological samples was determined by X-ray fluorescence spectrometry, a standard curve was established by using manual prepared standard samples and national standard samples. The results show that, the curve gradient is uniform and reasonable, the linearity is good. The method usesαempirical coefficient method to carry out matrix correction, and uses Rh Compton scattering as an internal standard to determine Sn in geological samples, the detection limit can reach 3.59 μg/g, and the relative standard deviation of the sample is about 3.1%,the test results is ideal.

关 键 词：X射线荧光光谱 地质样品 标准样品 α经验系数法 康普顿散射 

分 类 号：O657[理学—分析化学]