基于VCD文件的动态电压降分析流程概述  

Flow of dynamic IR drop analysis based on VCD file

作　　者：孟少鹏[1] 马强[1] 

机构地区：[1]中国电子科技集团公司第三十八研究所,安徽合肥230031

出　　处：《中国集成电路》2014年第5期20-23,共4页China lntegrated Circuit

摘　　要：随着先进工艺的发展,动态电压降成为必须考虑的因素。本文介绍了动态电压降的分析流程,采用Redhawk作为分析工具对一款SOC测试芯片进行动态电压降分析。分析结果表明该芯片动态电压降满足设计要求,并给出了改善动态电压降的几种技术手段。As technology node keeps scaling down, IR drop analysis must be taken into consideration. This paper presents the flow of dynamic IR drop analysis, which uses Redhawk tool to finish an analysis on a SOC testing chip. The result shows that IR drop on the chip meets the requirement of design. Several methods are also given to reduce ｜R drop in our research.

关 键 词：电压降 VCD APL 

分 类 号：TN402[电子电信—微电子学与固体电子学]