带状线法测量微波材料的复介电常数  

Strip-line Test Methods for Plural Permittivity of Microwave Material

作　　者：张文喜[1] 郑庆瑜[1] 郑彩平[1] 

机构地区：[1]中国电子科技集团公司第46研究所,天津300220

出　　处：《中国电子科学研究院学报》2014年第2期136-139,144,共5页Journal of China Academy of Electronics and Information Technology

基　　金：科工局基础科研配套项目

摘　　要：精确测量低损耗微波材料的复介电常数十分重要。利用带状线法测量微波介质基板常温和变温的复介电常数,得到了高精度的测试结果。结果表明了用带状线法测量低损耗微波介质基板复介电常数的有效性和准确性。还分析了带状线测试方法中产生的误差和应该注意的事项。It is necessary to get accurate plural permittivity of low loss microwave material. Strip-line test methods to measure plural permittivity of microwave dielectric substrate on normal and variable temperature are used,and accurate result is got. The result shows that the strip-line test methods to measure plural permittivity of low loss microwave material are validity and accuracy. The error and attention in the strip-line test methods are also analyzed.

关 键 词：变温测试 带状线法 复介电常数 复合介质 

分 类 号：TM25[一般工业技术—材料科学与工程]