基于半导体制冷原理的恒温实验箱控制系统研究  

A Research on Constant Temperate Experimental Box Control System Based on Semiconductor Refrigeration Principle

作　　者：陈英[1] 

机构地区：[1]柳州职业技术学院,广西柳州545006

出　　处：《柳州师专学报》2014年第1期113-116,共4页Journal of Liuzhou Teachers College

基　　金：2013年广西教育厅科研项目:制冷设备状态监测与故障诊断系统设计(2013YB354)

摘　　要：为了解决基于半导体制冷原理的恒温实验箱温度控制问题,设计了一种高精度温度控制方案.通过对半导体制冷过程进行建模,实现了基于半导体制冷技术在制冷工作过程量化描述.对恒温实验箱温度内温度变化进行监测与分析,设计了恒温实验箱内温度的高精度控制算法.仿真测试表明,恒温实验箱内12个温度测量点的平均温度波动为1%以内,单点的温度波动为4%.In order to apply the semiconductor refrigeration principle to control constant temperate experimental box, this paper de- signed a high-accuracy temperate control scheme. By modeling the semiconductor refrigerating process, it quantitatively described the semiconductor refrigerating technology in refrigerating working process. It monitored and studied the temperate change in constant temper- ate experimental box, designed a high-accuracy control algorithm. The simulation test indicated that the average temperate fluctuation range of 12 temperature observations in constant temperate experimental box is 1%, the punctual temperate is 4%.

关 键 词：恒温 控制系统 实验箱 半导体制冷 温度控制 

分 类 号：TB657[一般工业技术—制冷工程]