Design of transverse magnetic-reflected polarizing f ilm  

作　　者：李松权 高来勖 刘书钢 柳春郁 黄妍 叶红安 

机构地区：[1]School of Electronic Engineering, Heilongjiang University

出　　处：《Chinese Optics Letters》2014年第5期76-78,共3页中国光学快报（英文版）

基　　金：supported by the National Natural Science Foundation of China(No.61177079);the Young Scientists Fund of the National Natural Science Foundation of China(No.61205071.)

摘　　要：We propose a wideband transverse magnetic-reflected polarizing film composed of Cr and SiO2. Based on the polarization characteristics of reflected light from Cr/SiO2 film, the film can serves as a polarizer to severely attenuate the transverse electric （TE）-polarized light and reflect the transverse magnetic （TM）- polarized light in a wavelength range from 600 to 900 nm. By suitably choosing the film thicknesses, the operation angles of such polarizers can be adjusted over a wide angle range greater than the critical angle of total reflection. Cr/SiO2 film has potential use in surface plasmon resonance （SPR） sensors based on Kretchmann configuration to form integrated structures.We propose a wideband transverse magnetic-reflected polarizing film composed of Cr and SiO2. Based on the polarization characteristics of reflected light from Cr/SiO2 film, the film can serves as a polarizer to severely attenuate the transverse electric （TE）-polarized light and reflect the transverse magnetic （TM）- polarized light in a wavelength range from 600 to 900 nm. By suitably choosing the film thicknesses, the operation angles of such polarizers can be adjusted over a wide angle range greater than the critical angle of total reflection. Cr/SiO2 film has potential use in surface plasmon resonance （SPR） sensors based on Kretchmann configuration to form integrated structures.

关 键 词：Light polarization Optical instruments Surface plasmon resonance 

分 类 号：O484.4[理学—固体物理] O436.3[理学—物理]