FP标准具的温漂及光学材料光程温度系数的精确测量  

Thermal drift of FP etalon and precise measurement of thermal coefficient of optical length

作　　者：朱精敏[1] 朱旻翔 

机构地区：[1]浙江大学物理系,浙江杭州310027 [2]杭州精诚光电子有限公司,浙江杭州310000

出　　处：《物理实验》2014年第5期46-48,共3页Physics Experimentation

摘　　要：分析了FP标准具的温漂及精确测量光学材料光程nd温度系数的原理,指出了温漂率与厚度d无关,仅取决于材料特性,且与光频成正比.The thermal drift of FP etalon and precise measurement of the thermal coefficient of optical length were analyzed in principle.It was pointed out that the proportion of thermal drift was independent of thickness,it＇s decided by the characteristics of the material,and was proportional to the light frequency.

关 键 词：FP标准具 光程 温度系数 温漂 腔内选模 

分 类 号：O436.1[机械工程—光学工程] TH741.1[理学—光学]