Ray tracing method for the grazing incidence flat-field imaging soft X-ray spectrometer  

作　　者：董全力 刘运全 腾浩 李英骏 张杰 

机构地区：[1]School of Physics and Optoelectronic Engineering, Ludong University [2]Department of Physics, State Key Laboratory for Mesoscopic Physics, Peking University, Beijing 100871,China, Collaborative Innovation Center of Quantum Matter [3]Beijing National Laboratory of Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences [4]State Key Laboratory for GeoMechanics and Deep Underground Engineering, China University of Mining and Technology [5]Key Laboratory for Laser Plasmas (MoE) and Department of Physics, Shanghai Jiao Tong University

出　　处：《Chinese Physics B》2014年第6期392-397,共6页中国物理B（英文版）

基　　金：supported by the National Natural Science Foundation of China(Grant Nos.11221002,11274152,and 11074297)

摘　　要：A ray tracing method is introduced for helping adjustment and spectra analysis of the grazing incidence flat-field imaging soft X-ray spectrometer. For a single point source, the spectra images obtained by separate components, the toroidal mirror, and the grazing incidence flat-field concave grating with varied line spaces are given respectively. The calculated spectral images of the single point source by the spectrometer are also given for comparison with measurements with different experimental alignments.A ray tracing method is introduced for helping adjustment and spectra analysis of the grazing incidence flat-field imaging soft X-ray spectrometer. For a single point source, the spectra images obtained by separate components, the toroidal mirror, and the grazing incidence flat-field concave grating with varied line spaces are given respectively. The calculated spectral images of the single point source by the spectrometer are also given for comparison with measurements with different experimental alignments.

关 键 词：flat-field grating spectrometer soft X-ray diagnosis 

分 类 号：TH744.1[机械工程—光学工程]