X射线晶体光学性能光电综合测试方法  

Study of Optical Performance Measurement Method for X-Ray Scintillation Crystals

作　　者：韩跃平[1] 李瑞红[1] 

机构地区：[1]中北大学电子测试技术国家重点实验室,山西太原030051

出　　处：《激光与光电子学进展》2014年第6期111-116,共6页Laser & Optoelectronics Progress

基　　金：国家自然科学基金(601171178);山西省自然科学基金(2012011010-3);2012年度山西省高等学校优秀青年学术带头人支持计划

摘　　要：报道了一种针对X射线转换晶体光学性能综合测试的光电检测方法。从效能角度对测试装置进行优化,对系统固有的工频干扰与尖峰脉冲噪声采取了有效抑制措施。利用该装置测试了山西长城微光器材股份有限公司研制的某未知闪烁晶体的可见光光谱响应、光学转换效率、空间分辨率等性能。研究的光电综合测试方法为闪烁晶体材料的研制提供了一种性能测试借鉴。A photoelectrical test method and the system are developed for messuring the optical performances of some scintillation crystals. The theoretical critical focal length of the measurement system is deduced and used in order to make the most of both X-ray photons and the effective area of the scintillation crystal panel. Furthermore, coaxial cable ordered is used to replace the carried wire to remove power noise. Experiments are successfully done to integrally test the spectral response, conversion efficiency and spatial resolution of some scintillators made by Shanxi Changcheng Microlight Equipment Co. Ltd. and the results show that the presented system is helpful to test the scintillator properties.

关 键 词：测量 闪烁晶体 光学性能 光谱响应 转换效率 

分 类 号：O734[理学—晶体学] O434.1[机械工程—光学工程]