Mach-Zender干涉仪温度测量实验研究  

Experimental Research on the Temperature Measurement Based on M-Z Interferometer

作　　者：籍远明[1] 

机构地区：[1]青岛科技大学数理学院

出　　处：《电子技术（上海）》2014年第5期75-76,74,共3页Electronic Technology

摘　　要：文章基于Mach-Zender干涉仪结构原理,设计了一个温度测量实验。结果表明:当物体温度升高时,干涉仪条纹出现向左侧移动现象;当物体温度下降时,干涉仪条纹向右侧移动。温度的变化与条纹移动数目成线性相关性,线性拟合度为0.9996,对比实验进一步说明,Mach-Zender干涉仪测量温度具有很高的精度。Based on the principle of Mach-Zehnder interferometer, an experiment of temperature measurement is designed and demonstrated in this paper. The result shows that the interferometer strip appears a phenomena shifting to the left when temperature rises, and shifting to the right when the temperature falls. The stripe number has a linear correlation to temperature changing. The linear fitting is 0.9996. Comparative experiments further indicate that Mach-Zehnder interferometer for temperature measuring has high precision.

关 键 词：光纤 Mach-Zender干涉仪 温度测量 

分 类 号：O151.2[理学—数学]