反射光谱法估计小麦叶片表皮蜡质含量的初步研究  

Estimation of Leaf Cuticular Wax Content of Wheat Using Canopy Reflectance Spectrum

作　　者：高扬[1] 郭彤[1] 郝留根[1] 胡银岗[1,2] 

机构地区：[1]旱区作物逆境生物学国家重点实验室/西北农林科技大学农学院,陕西杨凌712100 [2]中国旱区节水农业研究院,陕西杨凌712100

出　　处：《麦类作物学报》2014年第4期509-515,共7页Journal of Triticeae Crops

基　　金：国家高技术研究发展计划(863计划)项目(2013AA102902);国家高等学校学科创新引智计划项目(B12007)

摘　　要：为了探讨利用冠层反射光谱技术估计小麦叶片表皮蜡质含量的可行性,以小麦高叶片表皮蜡质含量材料2912与低叶片表皮蜡质含量品种普冰201和晋麦47及其杂交构建的F2:3株系为材料,通过氯仿提取称重法测定了小麦抽穗期的旗叶表皮蜡质含量,并采用FieldSpec 3测定了冠层反射光谱,分析小麦冠层反射光谱与叶片表皮蜡质含量之间的关系。结果表明,三个亲本以及株系间蜡质含量差异显著。高蜡质材料的可见光波段反射率整体高于低蜡质材料,短波长波段光谱反射率与叶片表皮蜡质含量相关性较高。以550和675nm波长的反射光谱为基础的单波/差值指数[R550/(R550-R675)]能较好地反映小麦叶片蜡质含量,两F2:3群体拟合模型的r2值分别为0.761和0.679,回归方程分别为y=0.07x-0.575和y=0.088x-1.481。Cuticular wax is an important trait for wheat adaption to environmental changes,and plays an important role in the protection against adverse stresses such as diseases,pests,drought and high temperature.In order to establish a rapid method to estimate cuticular wax content in leaf of wheat, the high wax content line 2912,low wax content varieties Pubing 201and Jinmai 47,and their derived F2：3lines were used as materials,their cuticular wax contents of flag leaf at flowering stage were determined using the conventional method,and their canopy reflection spectrum were taken at the same time using Fieldspec 3,then the relationship between canopy spectral reflectance and leaf cuticular wax content was investigated to observe the sensitive wave-band and spectral characteristic parameters,which could reflect wheat leaf wax content.The results indicated that there were significant differences in wax content between the parents and among the F2：3lines;among the curve of canopy reflectance spectrum,the reflectance value in the visible region of materials with high cuticular wax content were higher than that of those with low cuticular wax content,and higher correlation was observed in the short wavelength band between leaf cuticular wax content and spectral reflectance value; the single-wave/differential reflective index R550/（R550-R675）was proposed to estimate the leaf cutic-ular wax content of wheat,compared with other existing reflectance parameters,the fitting degree of this index was the highest,with R2 value for the two populations as 0.761and 0.679,respectively; and the proposed regression equation was y=0.07x-0.575and y=0.088x-1.481for the two populations,respectively.The established non-destructive and rapid determination method of leaf wax content will promote the works on rapid determination of wheat leaf wax content and the related studies in the future.

关 键 词：小麦 叶片表皮蜡质含量 冠层反射光谱 估测方法 

分 类 号：S512.1[农业科学—作物学] S311