基于单片机的APD参数测试系统设计  

The design of the APD parameters test system based on SCM

作　　者：洪家平[1] 高美珍[2] 殷志文[1] 

机构地区：[1]湖北师范学院学院计算机科学与技术学院,湖北黄石435002 [2]湖北师范学院物理与电子科学学院,湖北黄石435002

出　　处：《湖北师范学院学报（自然科学版）》2014年第2期78-82,共5页Journal of Hubei Normal University(Natural Science)

摘　　要：雪崩光电二极管(APD)是一种高灵敏度、高速度的光电器件,是光纤接入的必备核心器件。其性能测试在业界一直存在成品率低、生产效率不高、精度低、不能大规模用于生产测试等问题。本测试系统采用单片机控制,具有价格低廉,效率高等特点,与国外普遍使用的数字源表来测量APD参数相比具有明显的优势。The avalanche photodiode（ APD） with high sensitivity and high-speed is the essential core of the fiber access triple play network device,and it＇s performance testing has been a low yield,production efficiency and accuracy in the industry.So they cannot be used for large-scale production. The test system in this paper controlling by the MCU have many characteristics,such as low price and high efficiency,to compare with foreigners mainly use source table to measure the APD parameters,it also has obvious advantages.

关 键 词：APD测试 单片机 升压电路 微小电流检测 

分 类 号：TP273.5[自动化与计算机技术—检测技术与自动化装置]